TY  - BOOK
AU  - Mayer, W James
AU  - Lau, S S
TI  - Electronic Materials Science: For Integrated Circuits in SI and GaAs
SN  - 0029460646
U1  - 621.38171 
CY  - New York
PB  - Macmillan Publishing Company
KW  - Current Flow, Capacitance, Bands, Barriers, Junctions, Transistors, Crystallography, Crystalline Defects, Diffusion in Solids, Ion Implantation, Thermal Oxidation of Silicon, Metallization, Phase Diagrams
ER  -