Mayer, W James
Electronic Materials Science For Integrated Circuits in SI and GaAs
- New York Macmillan Publishing Company
- 476p.
0029460646
Current Flow, Capacitance, Bands, Barriers, Junctions, Transistors, Crystallography, Crystalline Defects, Diffusion in Solids, Ion Implantation, Thermal Oxidation of Silicon, Metallization, Phase Diagrams
621.38171