Mayer, W James

Electronic Materials Science For Integrated Circuits in SI and GaAs - New York Macmillan Publishing Company - 476p.

0029460646

Current Flow, Capacitance, Bands, Barriers, Junctions, Transistors, Crystallography, Crystalline Defects, Diffusion in Solids, Ion Implantation, Thermal Oxidation of Silicon, Metallization, Phase Diagrams

621.38171