TY  - BOOK
AU  - Sirohi, S Rajpal
AU  - Kothiyal, P Mahendra
TI  - Optical Components, Systems, and Measurement Techniques
SN  - 0824783956
U1  - 621.36 
CY  - New York
PB  - Marcel Dekker Inc
KW  - Optical Systems, Alignment, Angle Measurement Techniques, Heterodyne, Phase Shifting Interferometry
ER  -