Sirohi, S Rajpal <br/><br/>
Optical Components, Systems, and Measurement Techniques 

 - New York  Marcel Dekker Inc 
 - 445p. 
<br/><br/><label>ISBN: </label>0824783956 
<br/><br/><label>Subjects--Index Terms: </label>Optical Systems, Alignment, Angle Measurement Techniques, Heterodyne, Phase Shifting Interferometry 
<br/><br/><label>Dewey Class. No.: </label>621.36